• DocumentCode
    2169592
  • Title

    Electromagnetic radiation and simultaneous switching noise in a CMOS device packaging

  • Author

    Sudo, Toshio ; Ko, Yakushi ; Sakaguchi, Shingo ; Tokumaru, Takeji

  • Author_Institution
    Corp. Manuf. Eng. Center, Toshiba Corp., Yokohama, Japan
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    781
  • Lastpage
    785
  • Abstract
    Electromagnetic interference (EMI) becomes a serious issue in electronic systems with the increase of the operating speed of digital circuits. Electromagnetic radiation occurs from cables, connectors, wiring pattern on PCB, LSI packages, heat sink and so on. They work as unwanted antenna. Shielding or filtering at the board level is not always efficient way to suppress the radiated emission. Recently, LSI chip itself has been recognized as dominant source of EMI. The switching current of the digital circuits induces the voltage fluctuations of power/ground lines, i.e. switching noise, Furthermore, the spreadout of switching current to the entire PCB excites the inherent resonance´s of PCB as an antenna. In this paper, the effects of the separation of power/ground lines for the core circuits from that for the I/O circuits and increased on-chip capacitance in a micro-controller chip were examined by using TEM (transverse electromagnetic) cell and a near-field probe system. And the combination of power/ground island in PCB for the core circuits was examined and analyzed by a simplified SPICE model
  • Keywords
    CMOS digital integrated circuits; SPICE; capacitance; electromagnetic interference; integrated circuit noise; integrated circuit packaging; large scale integration; microcontrollers; CMOS device packaging; LSI chip; PCB; SPICE model; decoupling capacitance; digital circuit; electromagnetic interference; electromagnetic radiation; electronic system; ground plane; microcontroller; near-field probe; power plane; simultaneous switching noise; transverse electromagnetic cell; Cables; Circuit noise; Connectors; Digital circuits; Electromagnetic interference; Electromagnetic radiation; Electronics packaging; Large scale integration; Switching circuits; Wiring;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components & Technology Conference, 2000. 2000 Proceedings. 50th
  • Conference_Location
    Las Vegas, NV
  • Print_ISBN
    0-7803-5908-9
  • Type

    conf

  • DOI
    10.1109/ECTC.2000.853248
  • Filename
    853248