Title :
A new analytical model for predicting SWCNT band-gap from geometrical properties
Author :
Shabrawy, Karim El ; Maharatna, Koushik ; Bagnall, Darren M. ; Al-Hashimi, Bashir M.
Author_Institution :
Sch. of Electron. & Comput. Sci. (ECS), Southampton Univ., Southampton
Abstract :
In the following paper we present a complete analytical model that predicts the band-gap (Eg) of single-walled carbon nanotubes (SWCNTs) directly from their diameter (d) and chiral angle (thetas). The proposed analytical model is based on two mathematical expressions that have been derived by curve-fitting the outcome generated from the third-nearest-neighbor tight-binding (TB) method in conjunction with the zone-folding technique. Tests performed on the model demonstrated that 82% of a set of both metallic and semiconducting CNTs were accurately distinguished. In addition, the maximum band-gap error recorded for the semiconducting tubes was 10%. The model was also verified against previously published experimental data where 17 out of 21 tubes were correctly predicted. Finally, it is shown that the proposed model computes Eg with a speed that is 105 times faster compared to the third-nearest-neighbor TB method with zone-folding. The outcome of this work offers a fast and accurate technique for engineers who are seeking to simulate CNT based devices and want to ascertain the CNTpsilas electronic properties with respect to the geometrical variation manifested in their synthesis process.
Keywords :
carbon nanotubes; curve fitting; tight-binding calculations; SWCNT band-gap; curve fitting; electronic properties; geometrical properties; semiconducting tubes; single-walled carbon nanotubes; tight binding method; zone folding; Analytical models; Carbon nanotubes; Computational modeling; Curve fitting; Performance evaluation; Photonic band gap; Predictive models; Semiconductivity; Semiconductor device testing; Solid modeling; Energy band gap; Single-Walled Carbon Nanotube (SWCNT) electronic properties; semiconductor device modeling; third-nearest-neighbor tight-binding model;
Conference_Titel :
Integrated Circuit Design and Technology and Tutorial, 2008. ICICDT 2008. IEEE International Conference on
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-1810-7
Electronic_ISBN :
978-1-4244-1811-4
DOI :
10.1109/ICICDT.2008.4567281