• DocumentCode
    2169752
  • Title

    A new analytical model for predicting SWCNT band-gap from geometrical properties

  • Author

    Shabrawy, Karim El ; Maharatna, Koushik ; Bagnall, Darren M. ; Al-Hashimi, Bashir M.

  • Author_Institution
    Sch. of Electron. & Comput. Sci. (ECS), Southampton Univ., Southampton
  • fYear
    2008
  • fDate
    2-4 June 2008
  • Firstpage
    211
  • Lastpage
    214
  • Abstract
    In the following paper we present a complete analytical model that predicts the band-gap (Eg) of single-walled carbon nanotubes (SWCNTs) directly from their diameter (d) and chiral angle (thetas). The proposed analytical model is based on two mathematical expressions that have been derived by curve-fitting the outcome generated from the third-nearest-neighbor tight-binding (TB) method in conjunction with the zone-folding technique. Tests performed on the model demonstrated that 82% of a set of both metallic and semiconducting CNTs were accurately distinguished. In addition, the maximum band-gap error recorded for the semiconducting tubes was 10%. The model was also verified against previously published experimental data where 17 out of 21 tubes were correctly predicted. Finally, it is shown that the proposed model computes Eg with a speed that is 105 times faster compared to the third-nearest-neighbor TB method with zone-folding. The outcome of this work offers a fast and accurate technique for engineers who are seeking to simulate CNT based devices and want to ascertain the CNTpsilas electronic properties with respect to the geometrical variation manifested in their synthesis process.
  • Keywords
    carbon nanotubes; curve fitting; tight-binding calculations; SWCNT band-gap; curve fitting; electronic properties; geometrical properties; semiconducting tubes; single-walled carbon nanotubes; tight binding method; zone folding; Analytical models; Carbon nanotubes; Computational modeling; Curve fitting; Performance evaluation; Photonic band gap; Predictive models; Semiconductivity; Semiconductor device testing; Solid modeling; Energy band gap; Single-Walled Carbon Nanotube (SWCNT) electronic properties; semiconductor device modeling; third-nearest-neighbor tight-binding model;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Integrated Circuit Design and Technology and Tutorial, 2008. ICICDT 2008. IEEE International Conference on
  • Conference_Location
    Austin, TX
  • Print_ISBN
    978-1-4244-1810-7
  • Electronic_ISBN
    978-1-4244-1811-4
  • Type

    conf

  • DOI
    10.1109/ICICDT.2008.4567281
  • Filename
    4567281