Title :
Probabilistic modeling of nanoscale adder
Author :
Lu, Xiaojun ; Li, Jianping ; Yang, Guo Wu ; Song, Xiaoyu
Author_Institution :
Sch. of Comput. Sci., Univ. of Electron. Sci. & Technol., Chengdu
Abstract :
This paper presents the probabilistic logic model to compute the probability distribution of the nano gate states. The characterization is based on the Markov random field and statistic physics. The primary logic gates are probabilistically characterized. The effectiveness of the method is demonstrated by a full adder and an 8-bit adder. The analysis shows that the device probability distribution highly depends on the system structures and other performance parameters.
Keywords :
Markov processes; adders; statistical distributions; Markov random field; nanoscale adder; probabilistic logic model; probability distribution; statistic physics; Adders; Distributed computing; Logic devices; Markov random fields; Nanoelectronics; Physics; Power system modeling; Probabilistic logic; Probability distribution; Statistical distributions; Digital circuit; nanoelectronics; probability; probability logic;
Conference_Titel :
Integrated Circuit Design and Technology and Tutorial, 2008. ICICDT 2008. IEEE International Conference on
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-1810-7
Electronic_ISBN :
978-1-4244-1811-4
DOI :
10.1109/ICICDT.2008.4567282
