• DocumentCode
    2169975
  • Title

    Dynamic measurement of critical-path timing

  • Author

    Drake, Alan J. ; Senger, Robert M. ; Singh, Harmander ; Carpenter, Gary D. ; James, Norman K.

  • Author_Institution
    IBM Res., Austin, TX
  • fYear
    2008
  • fDate
    2-4 June 2008
  • Firstpage
    249
  • Lastpage
    252
  • Abstract
    A high bandwidth critical path monitor (1 sample/ cycle at 4-5 GHz) capable of providing real-time timing margin information to a variable voltage/frequency scaling control loop is described. The critical path monitor tracks the critical path delay to within 1 FO2 inverter delay with a standard deviation less than 3 FO2 delays over process, voltage, temperature, and workload. The CPM is sensitive to 20 mV/bit A/C and 10 mV/bit DC voltage changes, and less than 10degC/bit temperature changes.
  • Keywords
    delays; invertors; microwave circuits; timing circuits; voltage-frequency convertors; FO2 inverter delay; critical path monitor; critical-path timing; dynamic measurement; frequency 4 GHz to 5 GHz; real-time timing margin information; variable voltage-frequency scaling control loop; Calibration; Clocks; Control systems; Delay; Monitoring; Signal generators; Synchronization; Temperature sensors; Timing; Voltage; Calibration; Critical Path Monitor; DVFS;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Integrated Circuit Design and Technology and Tutorial, 2008. ICICDT 2008. IEEE International Conference on
  • Conference_Location
    Austin, TX
  • Print_ISBN
    978-1-4244-1810-7
  • Electronic_ISBN
    978-1-4244-1811-4
  • Type

    conf

  • DOI
    10.1109/ICICDT.2008.4567288
  • Filename
    4567288