DocumentCode
2169979
Title
Advanced surface plating on the organic FC-BGA package
Author
Tomia, Y. ; Wu, Qiang ; Maeda, Akira ; Baba, Shinji ; Ueda, Naoto
Author_Institution
Manuf. Technol. Div., Mitsubishi Electr. Corp., Hyogo, Japan
fYear
2000
fDate
2000
Firstpage
861
Lastpage
867
Abstract
Electric components and devices have become high density more and more because of demands for high performance. Nowadays, electroless surface plating is often applied to the surface finish of substrate land patterns for soldering and interconnections due to the enhancement of the wiring design on the mounting hoard, which leads to the shrinkage of the devices. In some cases, though, electroless plating causes weak solder joints on the external terminals of electric devices and packages. The key issue on the developed organic FC-BGA (Flip-chip Ball Grid Array) packaging process is to achieve the ball attach strength on the substrate lands with electroless nickel and immersion gold plating. It was confirmed that the root cause of the weak strength was the existence of the phosphoric enrichment layer with the detailed analysis. Additionally, regarding with the new approach to solve the weak solder joint, the DCNP (double-layered constructed nickel plating) was effective in preventing the progress of the phosphoric enrichment layer
Keywords
ball grid arrays; electroless deposition; flip-chip devices; organic compounds; soldering; Au; Ni; double-layered constructed nickel plating; electroless nickel plating; flip-chip ball grid array; immersion gold plating; organic FC-BGA package; phosphoric enrichment layer; solder ball attach strength; surface plating; Electronics packaging; Gold; LAN interconnection; Land surface; Lead; Nickel; Soldering; Surface finishing; Wiring;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components & Technology Conference, 2000. 2000 Proceedings. 50th
Conference_Location
Las Vegas, NV
Print_ISBN
0-7803-5908-9
Type
conf
DOI
10.1109/ECTC.2000.853263
Filename
853263
Link To Document