Title :
On-chip circuit for measuring jitter and skew with picosecond resolution
Author :
Jenkins, K.A. ; Jose, A.P. ; Xu, Z. ; Shepard, K.L.
Author_Institution :
IBM Thomas J. Watson Res. Center, Yorktown Heights, NY
Abstract :
A circuit for on-chip measurement of long-term jitter, period jitter, and clock skew, is demonstrated. The circuit uses a single latch and a voltage-controlled delay element, and is evaluated in a stand-alone pad frame. Excellent reproduction of jitter measured by oscilloscope is shown. Measured jitter resolution is 1 ps or better. The circuit is also incorporated into a 2 GHz clock distribution network to obtain on-chip period jitter and clock skew measurements.
Keywords :
clocks; integrated circuit measurement; integrated circuit testing; jitter; logic testing; clock distribution network; clock skew measurements; frequency 2 GHz; jitter resolution; long-term jitter; on-chip circuit; on-chip period jitter measurements; picosecond resolution; voltage-controlled delay element; Circuits; Clocks; Delay effects; Latches; Oscilloscopes; Phase measurement; Semiconductor device measurement; Time measurement; Timing jitter; Voltage; Jitter; built-in self test; clock distribution; clock skew; long-term jitter; on-chip measurement; period jitter; tracking jitter;
Conference_Titel :
Integrated Circuit Design and Technology and Tutorial, 2008. ICICDT 2008. IEEE International Conference on
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-1810-7
Electronic_ISBN :
978-1-4244-1811-4
DOI :
10.1109/ICICDT.2008.4567290
