DocumentCode
2170358
Title
Correlation-reduced scan-path design to improve delay fault coverage
Author
Mao, Weiwei ; Ciletti, Michael D.
Author_Institution
University of Colorado
fYear
1991
fDate
21-21 June 1991
Firstpage
73
Lastpage
79
Keywords
Algorithm design and analysis; Benchmark testing; Circuit faults; Circuit simulation; Circuit testing; Delay effects; Hardware; Latches; Permission; Sequential analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 1991. 28th ACM/IEEE
Conference_Location
IEEE
Print_ISBN
0-89791-395-7
Type
conf
Filename
979692
Link To Document