DocumentCode :
2170415
Title :
Evaluation and characterization of high-performance filling encapsulants for system chips application
Author :
Wu, Jiali ; Bhattacharya, Swapan K. ; Wong, Michelle ; Lloyd, Courtney ; Tummala, Rao R. ; Wong, C.P. ; Pogge, H. Bernhard
Author_Institution :
Sch. of Mater. Sci. & Eng., Georgia Inst. of Technol., Atlanta, GA, USA
fYear :
2000
fDate :
2000
Firstpage :
937
Lastpage :
943
Abstract :
An innovative Precisely Interconnected Chips (PIC) technology is currently under development at IBM to seek more effective means of creating system chips. This development focuses on developing fabrication methods to permit the realization of high yielding large area chips, as well as chips that may contain very diverse technologies. Another focus is to realize system chips which have their basic chip characteristics compromised as is the case in many of today´s system chip concepts. This paper reports on the use of a high performance filling encapsulant based on epoxy resin, which is used to connect the different chip sector macros that make up the system chip. This novel encapsulant remains thermally stable through the subsequent processing temperature hierarchies during the system chips fabrication. Spherical SiO2 powders (with special morphology and size distribution) are incorporated into the epoxy resin to improve its mechanical properties, reduce coefficient of thermal expansion, and increase thermal conductivity. Adhesion and rheological properties of the formulated materials are evaluated. Microstructure of the filled Epoxy system is investigated to confirm the thermal reliability of the encapsulants. The formulated EPOXY A resin is qualified for manufacturing process based on the filling process, mechanical integrity, and thermal reliability
Keywords :
encapsulation; integrated circuit packaging; polymers; EPOXY A polymer; Precisely Interconnected Chips technology; SiO2; SiO2 spherical powder; adhesion; epoxy resin; filling encapsulant; mechanical properties; microstructure; rheological properties; system chip fabrication; thermal conductivity; thermal expansion; thermal reliability; Chip scale packaging; Epoxy resins; Fabrication; Filling; Mechanical factors; Morphology; Powders; Temperature; Thermal conductivity; Thermal expansion;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components & Technology Conference, 2000. 2000 Proceedings. 50th
Conference_Location :
Las Vegas, NV
Print_ISBN :
0-7803-5908-9
Type :
conf
DOI :
10.1109/ECTC.2000.853279
Filename :
853279
Link To Document :
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