Title :
AFM analysis of wobble amplitude
Author :
Burkhead, David L. ; Chernoff, D.A.
Author_Institution :
Adv. Surface Microscopy Inc., Indianapolis, IN, USA
Abstract :
We directly measure track wobble amplitude in recordable optical disc media using AFM images and automated analysis procedures. Wobble amplitude of 30 nm is easily measured, but calibration is important in order to avoid errors.
Keywords :
atomic force microscopy; optical disc storage; AFM imaging; automated analysis; calibration; optical disc; wobble amplitude; Atomic force microscopy; Calibration; Image analysis; Manufacturing; Optical microscopy; Optical recording; Size measurement; Spirals; Timing; Trajectory;
Conference_Titel :
Optical Memory and Optical Data Storage Topical Meeting, 2002. International Symposium on
Print_ISBN :
0-7803-7379-0
DOI :
10.1109/OMODS.2002.1028667
