Title :
Mining Complex Boolean Expressions for Sequential Equivalence Checking
Author :
Goel, Neha ; Hsiao, Michael S. ; Ramakrishnan, N. ; Zaki, Mohammed J
Author_Institution :
Dept. of Electr. & Comput. Eng., Virginia Tech, Blacksburg, VA, USA
Abstract :
We propose a novel technique to mine powerful and generalized boolean relations among flip-flops in a sequential circuit for sequential equivalence checking. In contrast to traditional learning methods, our mining algorithm can detect inductive invariants as well as illegal state cubes. These invariants can be arbitrary boolean expressions and can thus prune a large don´t care space during equivalence checking. Experimental results demonstrate that these general invariants can be very effective for sequential equivalence checking of circuits with no or very few equivalent signals between them, with low computational costs.
Keywords :
Boolean functions; flip-flops; sequential circuits; flip-flops; mining complex Boolean expressions; sequential circuit; sequential equivalence checking; Benchmark testing; Data mining; Databases; Frequency modulation; Generators; Logic gates; Optimization; BLOSOM; Induction based proof; Re-descriptions; Sequential Equivalence Checking;
Conference_Titel :
Test Symposium (ATS), 2010 19th IEEE Asian
Conference_Location :
Shanghai
Print_ISBN :
978-1-4244-8841-4
DOI :
10.1109/ATS.2010.81