Title :
Algorithms for fast, memory efficient switch-level fault simulation
Author :
Vandris, E. ; Sobelman, G.
Author_Institution :
University of Minnesota
Keywords :
Circuit faults; Circuit simulation; Computational modeling; Discrete event simulation; MOSFETs; Manufacturing; Permission; Sequential circuits; Switching circuits; Wire;
Conference_Titel :
Design Automation Conference, 1991. 28th ACM/IEEE
Conference_Location :
IEEE
Print_ISBN :
0-89791-395-7