DocumentCode
2170600
Title
Sequential circuit fault simulation by fault information tracing algorithm : FIT
Author
Kitamura, Yoshihiro
Author_Institution
NTT LSI Laboratories
fYear
1991
fDate
21-21 June 1991
Firstpage
151
Lastpage
154
Keywords
Analytical models; Cause effect analysis; Circuit faults; Circuit simulation; Clocks; Combinational circuits; Convergence; Electrical fault detection; Permission; Sequential circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 1991. 28th ACM/IEEE
Conference_Location
IEEE
Print_ISBN
0-89791-395-7
Type
conf
Filename
979704
Link To Document