DocumentCode :
2170600
Title :
Sequential circuit fault simulation by fault information tracing algorithm : FIT
Author :
Kitamura, Yoshihiro
Author_Institution :
NTT LSI Laboratories
fYear :
1991
fDate :
21-21 June 1991
Firstpage :
151
Lastpage :
154
Keywords :
Analytical models; Cause effect analysis; Circuit faults; Circuit simulation; Clocks; Combinational circuits; Convergence; Electrical fault detection; Permission; Sequential circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 1991. 28th ACM/IEEE
Conference_Location :
IEEE
Print_ISBN :
0-89791-395-7
Type :
conf
Filename :
979704
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2170600
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