Title :
CQED-Enhanced Single Photon Sources From InGaAs Quantum Dots
Author :
Hu, C.Y. ; Gibson, R. ; Timpson, J.A. ; Lam, S. ; Fox, A.M. ; Skolnick, M.S. ; Hopkinson, M. ; Tahraoui, A. ; Rarity, J.G.
Author_Institution :
Bristol Univ., Bristol
Abstract :
Historically non-classical sources of single photons have been used to test quantum mechanics and to develop the field of quantum optics. Nowadays the single photon source has become a critical device for quantum communications and optical quantum information processing [Knill, et al., 2001]. A single photon source emits one photon at a time, and its quality can be evaluated by three parameters: quantum efficiency, multi-photon probability, and photon distinguishability. Among the different types single photon sources, InGaAs/GaAs quantum dots (QDs) are a promising solid state candidate showing high quantum efficiency, no bleaching effect, long-term stability, capable of high repetition rate, and compatible with standard semiconductor processing techniques. Furthermore, QDs can be embedded in micro-cavities or photonic crystal nano-cavities by in situ growth, and thus cavity quantum electrodynamics (CQED) can be exploited to improve the performance of QD-based single photon sources in all aspects mentioned above [Santori, et al., 2002].
Keywords :
III-V semiconductors; gallium arsenide; indium compounds; light sources; quantum optics; semiconductor quantum dots; InGaAs; cavity quantum electrodynamics; microcavities; multiphoton probability; optical quantum information processing; photon distinguishability; photonic crystal nanocavities; quantum communications; quantum dots; quantum mechanics; quantum optics; single photon sources; Gallium arsenide; Indium gallium arsenide; Information processing; Optical devices; Photonic crystals; Quantum dots; Quantum mechanics; Solid state circuits; Stimulated emission; Testing;
Conference_Titel :
Lasers and Electro-Optics, 2007 and the International Quantum Electronics Conference. CLEOE-IQEC 2007. European Conference on
Conference_Location :
Munich
Print_ISBN :
978-1-4244-0931-0
Electronic_ISBN :
978-1-4244-0931-0
DOI :
10.1109/CLEOE-IQEC.2007.4386767