DocumentCode
2170629
Title
Parallel test generation for sequential circuits on general-purpose multiprocessors
Author
Patil, Srinivas ; Banerjee, Prithu ; Patel, Janak H.
Author_Institution
IBM Corporation
fYear
1991
fDate
21-21 June 1991
Firstpage
155
Lastpage
159
Keywords
Circuit faults; Circuit testing; Hardware; Iterative algorithms; Logic arrays; Logic testing; Permission; Sequential analysis; Sequential circuits; Synchronous generators;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 1991. 28th ACM/IEEE
Conference_Location
IEEE
Print_ISBN
0-89791-395-7
Type
conf
Filename
979705
Link To Document