DocumentCode :
2170629
Title :
Parallel test generation for sequential circuits on general-purpose multiprocessors
Author :
Patil, Srinivas ; Banerjee, Prithu ; Patel, Janak H.
Author_Institution :
IBM Corporation
fYear :
1991
fDate :
21-21 June 1991
Firstpage :
155
Lastpage :
159
Keywords :
Circuit faults; Circuit testing; Hardware; Iterative algorithms; Logic arrays; Logic testing; Permission; Sequential analysis; Sequential circuits; Synchronous generators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 1991. 28th ACM/IEEE
Conference_Location :
IEEE
Print_ISBN :
0-89791-395-7
Type :
conf
Filename :
979705
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2170629
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