Title :
Development of polarized electron sources using AlGaAs-GaAs superlattice and using strained GaAs
Author :
Nakanishi, T. ; Kurihara, Y. ; Omori, T. ; Aoyagi, H. ; Baba, T. ; Furuya, T. ; Horinaka, H. ; Itoga, K. ; Kamiya, Y. ; Kato, T. ; Mizuta, M. ; Nakamura, S. ; Saka, T. ; Takeuchi, Y. ; Tsubata, M. ; Yoshioka, M.
Author_Institution :
Fac. of Sci., Nagoya Univ., Aichi, Japan
Abstract :
Two types of polarized electron sources have been developed. First, an Al/sub 0.35/Ga/sub 0.65/As-GaAs superlattice grown by the MBE (molecular beam epitaxy) method was examined. The maximum polarization of 71.2+or-1.1(stat.) +or-6.1(sys.)% was obtained at a photon wavelength of 802 nm at room temperature. Second, a strained GaAs layer was grown on a GaP/sub 0.17/As/sub 0.83/ base layer by the MOCVD (metalorganic chemical vapor deposition) method: the maximum polarization of 85.0+or-1.1(stat.)+or-6.3(sys.)% was obtained at a photon wavelength of 860 nm at room temperature. It is concluded that the GaAs epilayer strained by the lattice-mismatch of the heterojunction and the AlGaAs-GaAs superlattice are potential candidates for the new photocathode of a polarized electron source, because they have much higher polarization than the GaAs photocathode and a reasonable quantum efficiency.<>
Keywords :
III-V semiconductors; aluminium compounds; gallium arsenide; photoelectron spectra; semiconductor epitaxial layers; semiconductor superlattices; spin polarised electron emission; 802 nm; 860 nm; AlGaAs-GaAs; GaAs-GaPAs; MBE; epilayer; heterojunction; lattice-mismatch; metalorganic chemical vapor deposition; molecular beam epitaxy; photocathode; polarized electron sources; quantum efficiency; Cathodes; Chemical vapor deposition; Electron sources; Gallium arsenide; Heterojunctions; MOCVD; Molecular beam epitaxial growth; Polarization; Superlattices; Temperature;
Conference_Titel :
Particle Accelerator Conference, 1991. Accelerator Science and Technology., Conference Record of the 1991 IEEE
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-0135-8
DOI :
10.1109/PAC.1991.164860