DocumentCode :
2170679
Title :
On removing redundancy in sequential circuits
Author :
Cheng, Kwang-Ting
Author_Institution :
AT&T Bell Laboratories
fYear :
1991
fDate :
21-21 June 1991
Firstpage :
164
Lastpage :
169
Keywords :
Circuit faults; Circuit testing; Combinational circuits; Fault diagnosis; Feedback circuits; Flip-flops; Logic; Redundancy; Sequential analysis; Sequential circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 1991. 28th ACM/IEEE
Conference_Location :
IEEE
Print_ISBN :
0-89791-395-7
Type :
conf
Filename :
979707
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2170679
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