DocumentCode
2170679
Title
On removing redundancy in sequential circuits
Author
Cheng, Kwang-Ting
Author_Institution
AT&T Bell Laboratories
fYear
1991
fDate
21-21 June 1991
Firstpage
164
Lastpage
169
Keywords
Circuit faults; Circuit testing; Combinational circuits; Fault diagnosis; Feedback circuits; Flip-flops; Logic; Redundancy; Sequential analysis; Sequential circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 1991. 28th ACM/IEEE
Conference_Location
IEEE
Print_ISBN
0-89791-395-7
Type
conf
Filename
979707
Link To Document