On-Chip Copper-Based vs. Optical Interconnects: Delay Uncertainty, Latency, Power, and Bandwidth Density Comparative Predictions

Author

Chen, Guoqing ; Chen, Hui ; Haurylau, Mikhail ; Nelson, Nicholas A. ; Albonesi, David H. ; Fauchet, Philippe M. ; Friedman, Eby G.

Author_Institution

Dept. of Electr. & Comput. Eng.,, Rochester Univ., NY

fYear

2006

fDate

5-7 June 2006

Firstpage

39

Lastpage

41

Abstract

As CMOS technology is scaled, it has become increasingly difficult for conventional copper interconnect to satisfy different design requirements. On-chip optical interconnect has been considered as a potential substitute for electrical interconnect. In this paper, predictions of the performance of CMOS compatible optical devices are made based on current state-of-art optical technologies. Based on these predictions, electrical and optical interconnects are compared for delay uncertainty, latency, power, and bandwidth density

Keywords

CMOS integrated circuits; integrated circuit interconnections; integrated optoelectronics; optical interconnections; CMOS technology; bandwidth density; delay uncertainty; optical devices; optical interconnect; optical technology; Bandwidth; CMOS technology; Copper; Delay; Optical devices; Optical interconnections; Optical receivers; Optical transmitters; Uncertainty; Wire;

fLanguage

English

Publisher

ieee

Conference_Titel

Interconnect Technology Conference, 2006 International

Conference_Location

Burlingame, CA

Print_ISBN

1-4244-0104-6

Type

conf

DOI

10.1109/IITC.2006.1648640

Filename

1648640