Title :
Amap: a technology mapper for selector-based field-programmable gate arrays
Author_Institution :
University of California
Keywords :
Circuit testing; Computer architecture; Costs; Distributed computing; Field programmable gate arrays; Joining processes; Logic arrays; Machinery; Permission; Wire;
Conference_Titel :
Design Automation Conference, 1991. 28th ACM/IEEE
Conference_Location :
IEEE
Print_ISBN :
0-89791-395-7
