DocumentCode :
2171326
Title :
A design for testability scheme with applications to data path synthesis
Author :
Chiu, Scott ; Papachristou, Christos A.
Author_Institution :
Case Western Reserve University
fYear :
1991
fDate :
21-21 June 1991
Firstpage :
271
Lastpage :
277
Keywords :
Automatic testing; Control system synthesis; Costs; Design for testability; Hardware; High level synthesis; Permission; Semiconductor device testing; System testing; Time measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 1991. 28th ACM/IEEE
Conference_Location :
IEEE
Print_ISBN :
0-89791-395-7
Type :
conf
Filename :
979727
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2171326
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