DocumentCode
2171326
Title
A design for testability scheme with applications to data path synthesis
Author
Chiu, Scott ; Papachristou, Christos A.
Author_Institution
Case Western Reserve University
fYear
1991
fDate
21-21 June 1991
Firstpage
271
Lastpage
277
Keywords
Automatic testing; Control system synthesis; Costs; Design for testability; Hardware; High level synthesis; Permission; Semiconductor device testing; System testing; Time measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 1991. 28th ACM/IEEE
Conference_Location
IEEE
Print_ISBN
0-89791-395-7
Type
conf
Filename
979727
Link To Document