DocumentCode
2171340
Title
Enhanced controllability for IDDQ test sets using partial scan
Author
Chakraborty, Tapan J. ; Bhawmik, Sudipta ; Bencivenga, Robert ; Lin, C.J.
Author_Institution
AT&T Bell Labs, ERC
fYear
1991
fDate
21-21 June 1991
Firstpage
278
Lastpage
281
Keywords
Built-in self-test; CMOS technology; Circuit faults; Circuit testing; Controllability; Logic testing; Permission; Sequential analysis; Sequential circuits; Test pattern generators;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 1991. 28th ACM/IEEE
Conference_Location
IEEE
Print_ISBN
0-89791-395-7
Type
conf
Filename
979728
Link To Document