• DocumentCode
    2171384
  • Title

    ATPG based on a novel grid-addressable latch element

  • Author

    Chandra, Susheel J. ; Ferry, Tom ; Gheewala, Tushar ; Pierce, Kerry

  • Author_Institution
    CrossCheck Technology Inc.
  • fYear
    1991
  • fDate
    21-21 June 1991
  • Firstpage
    282
  • Lastpage
    286
  • Keywords
    Application specific integrated circuits; Automatic test pattern generation; Circuit testing; Controllability; Integrated circuit testing; Latches; Observability; Permission; Probes; Sequential circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 1991. 28th ACM/IEEE
  • Conference_Location
    IEEE
  • Print_ISBN
    0-89791-395-7
  • Type

    conf

  • Filename
    979729