DocumentCode
2171409
Title
Graph partitioning for concurrent test scheduling in VLSI circuit
Author
Chen, Chien In Henry
Author_Institution
Wright State University
fYear
1991
fDate
21-21 June 1991
Firstpage
287
Lastpage
290
Keywords
Automatic testing; Built-in self-test; Circuit testing; Combinational circuits; Logic testing; Performance evaluation; Permission; Registers; Space exploration; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 1991. 28th ACM/IEEE
Conference_Location
IEEE
Print_ISBN
0-89791-395-7
Type
conf
Filename
979730
Link To Document