• DocumentCode
    2171534
  • Title

    The effect of sliding wear on lubricated tin-lead contacts

  • Author

    Aukland, Neil ; Hardee, Harry

  • Author_Institution
    Adv. Interconnection Lab., New Mexico State Univ., Las Cruces, NM, USA
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    1173
  • Lastpage
    1177
  • Abstract
    Tin-based material systems are used extensively in connector interfaces, because tin based material systems are cost effective and have advantageous corrosion characteristics. One of the weaknesses of these material systems is poor wear characteristics. In general, connectors experience two different types of wear at their interfaces that will shorten their service life: sliding wear and fretting wear. This paper will concentrate on sliding wear, which occurs whenever a connector is mated and unmated. Data are presented for a series of sliding wear experiments, under 50 and 150 grams normal loads. The cyclic movement is 0.1 inch at 0.1 inch/sec. Wear-out of the connector interface has been determined by monitoring the dynamic coefficient of friction and by analysis of the wear track using an optical microscope. The benefit of using a special formulation of a CLT: X-10 lubricant at the interface to protect the tin/lead material system is demonstrated, through the use of a new first order sliding wear model
  • Keywords
    corrosion; electric connectors; electrical contacts; lead alloys; lubrication; optical microscopy; sliding friction; tin alloys; wear; 150 g; 50 g; SnPb; connector interfaces; corrosion characteristics; cyclic movement; dynamic coefficient; dynamic coefficient of friction; first order wear model; lubricated contacts; optical microscope; sliding wear; wear characteristics; wear track; Connectors; Contacts; Corrosion; Costs; Friction; Lubricants; Monitoring; Optical microscopy; Protection; Tin;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components & Technology Conference, 2000. 2000 Proceedings. 50th
  • Conference_Location
    Las Vegas, NV
  • Print_ISBN
    0-7803-5908-9
  • Type

    conf

  • DOI
    10.1109/ECTC.2000.853321
  • Filename
    853321