Title :
PXI-based specific-to-type test equipment for two-level testing of an airborne intelligent power management unit
Author :
Boosnur, Sharath B. ; Kumar, R. Naveen ; Aggarwal, Vaneet ; Ramachandra, V.
Author_Institution :
Aeronaut. Dev. Establ., Bangalore, India
Abstract :
Testing and Verification is an important requirement in the qualification of modern avionic systems. The simpler systems had functionalities which were defined in terms of fixed outputs for fixed inputs. Due to the advent of microcontrollers and Field Programmable Gate Arrays (FPGA), current systems involve inbuilt memories and intelligent features. Testing of such systems usually gets elaborate and repetitive with various modes of operation to be tested. This testing methodology is best suited for automated test equipment. Peripheral Extension for Instrumentation (PXI) based systems are becoming the new standard for implementation of test equipments where intelligent units are involved. This paper discusses one such application where a PXI-based system has been deployed successfully for testing of an airborne intelligent Power Management Unit. The intricacies involved in the testing process and the extent to which the test system verifies the functionality are also discussed.
Keywords :
automatic test equipment; avionics; field programmable gate arrays; microcontrollers; FPGA; PXI-based specific-to-type test equipment; airborne intelligent power management unit; automated test equipment; current systems; field programmable gate arrays; microcontrollers; modern avionic systems; peripheral extension for instrumentation; simpler systems; two-level testing; Automation; PXI; Power Management; Testing;
Conference_Titel :
Advanced Electronic Systems (ICAES), 2013 International Conference on
Conference_Location :
Pilani
Print_ISBN :
978-1-4799-1439-5
DOI :
10.1109/ICAES.2013.6659358