DocumentCode :
2171723
Title :
A data path synthesis method for self-testable designs
Author :
Papachristou, Christos A. ; Chiu, Scott ; Harmanani, Haidar
Author_Institution :
Case Western Reserve University
fYear :
1991
fDate :
21-21 June 1991
Firstpage :
378
Lastpage :
384
Keywords :
Algorithm design and analysis; Automatic testing; Built-in self-test; Circuit testing; Design for testability; Design methodology; Heuristic algorithms; High level synthesis; Permission; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 1991. 28th ACM/IEEE
Conference_Location :
IEEE
Print_ISBN :
0-89791-395-7
Type :
conf
Filename :
979745
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2171723
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