DocumentCode :
2171921
Title :
Short-Open Calibration Technique for Accurate LE-FDTD Simulation of MEM switches
Author :
Fantauzzi, A. ; Alimenti, F. ; Mezzanotte, P. ; Farina, M. ; Roselli, L.
Author_Institution :
Dip. di Ingegneria Elettronica e dell´´Informazione, UniversitÃ\xa0 di Perugia, Perugia, Italy. Tel: +39-76-585.3662, Fax: +39-76-585.3654, E-mail: midnite@diei.unipg.it
fYear :
2002
fDate :
23-26 Sept. 2002
Firstpage :
1
Lastpage :
3
Abstract :
This paper proposes an accurate analysis of Microelectromechnanical (MEM) switches using the Lumped Element-Finite Difference Time Domain (LE-FDTD) method enriched of the Short-Open Calibration (SOC) technique. The application of this method allows the electrical behavior of MEM switches to be accurately predicted while reducing the computational CPU time.
Keywords :
Calibration; Computational geometry; Equations; Equivalent circuits; Scattering parameters; Switches; Symmetric matrices; Time domain analysis; Voltage; Zirconium;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference, 2002. 32nd European
Conference_Location :
Milan, Italy
Type :
conf
DOI :
10.1109/EUMA.2002.339338
Filename :
4140418
Link To Document :
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