Title :
A general purpose multiple way partitioning algorithm
Author :
Ching-wei Yeh ; Chung-kuan Cheng
Author_Institution :
University of California
Keywords :
Circuit testing; Clustering algorithms; Computer science; Cost function; Iterative algorithms; Joining processes; Partitioning algorithms; Permission; Pins; Timing;
Conference_Titel :
Design Automation Conference, 1991. 28th ACM/IEEE
Conference_Location :
IEEE
Print_ISBN :
0-89791-395-7
