DocumentCode :
2172034
Title :
A probabilitistic testability measure for delay faults
Author :
Wu, Wen Ching ; Lee, Chung Len
Author_Institution :
National Chiao Tung Univ.
fYear :
1991
fDate :
21-21 June 1991
Firstpage :
440
Lastpage :
445
Keywords :
Circuit faults; Circuit simulation; Circuit testing; Combinational circuits; Delay; Logic testing; Permission; Robustness; Sequential analysis; Sequential circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 1991. 28th ACM/IEEE
Conference_Location :
IEEE
Print_ISBN :
0-89791-395-7
Type :
conf
Filename :
979756
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2172034
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