DocumentCode

2172095

Title

Testability of asynchronous timed control circuits with delay assumptions

Author

Beerel, Peter A. ; Meng, Teresa H Y

Author_Institution

Stanford University

fYear

1991

fDate

21-21 June 1991

Firstpage

446

Lastpage

451

Keywords

Asynchronous circuits; Automatic testing; Circuit testing; Clocks; Delay; Laboratories; Logic testing; Permission; Sufficient conditions; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Design Automation Conference, 1991. 28th ACM/IEEE

Conference_Location

IEEE

Print_ISBN

0-89791-395-7

Type

conf

Filename

979757