Title :
Testability of asynchronous timed control circuits with delay assumptions
Author :
Beerel, Peter A. ; Meng, Teresa H Y
Author_Institution :
Stanford University
Keywords :
Asynchronous circuits; Automatic testing; Circuit testing; Clocks; Delay; Laboratories; Logic testing; Permission; Sufficient conditions; System testing;
Conference_Titel :
Design Automation Conference, 1991. 28th ACM/IEEE
Conference_Location :
IEEE
Print_ISBN :
0-89791-395-7
