• DocumentCode
    2172193
  • Title

    Solder joint shape formation under constrained boundaries in wafer level underfill

  • Author

    Nguyen, L. ; Nguyen, H.

  • Author_Institution
    Nat. Semicond. Corp., Santa Clara, CA, USA
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    1320
  • Lastpage
    1325
  • Abstract
    Standard underfill processing occurs at the package level and is slow since it relies on the capillary flow of the resin. The dispensing operation requires from 30 to 120 seconds depending on the die geometry, bump pattern, standoff, and material characteristics. Even with the “no-flow” materials introduced recently in the market, processing is still carried out at the unit level. Upon completion of the underfill operation, batch curing is done for an additional amount of time. Thus, when multiplied by the number of dies on a wafer, the total process time can be quite substantial. Wafer level deposition of underfill is the next paradigm shift in flip chip packaging, offering both cost savings and higher throughput than with the conventional process. The resin is applied to the wafer and soft-cured prior to singulation. Final cure of the film is achieved during assembly reflow. A number of challenges do exist in this new process relating to material formulation and processing. This paper discusses the issue of solder wettability during reflow, while the solder balls are being constrained by a polymeric underfill layer
  • Keywords
    encapsulation; flip-chip devices; integrated circuit packaging; reflow soldering; assembly reflow; flip-chip packaging; polymer resin; soft curing; solder joint shape formation; wafer level underfill processing; wettability; Costs; Curing; Flip chip; Geometry; Packaging; Resins; Shape; Soldering; Throughput; Wafer scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components & Technology Conference, 2000. 2000 Proceedings. 50th
  • Conference_Location
    Las Vegas, NV
  • Print_ISBN
    0-7803-5908-9
  • Type

    conf

  • DOI
    10.1109/ECTC.2000.853347
  • Filename
    853347