DocumentCode
2172221
Title
Enabling concurrent clock and power gating in an industrial design flow
Author
Bolzani, Leticia ; Calimera, Andrea ; Macii, Alberto ; Macii, Enrico ; Poncino, Massimo
Author_Institution
Dipt. di Autom. e Inf., Politec. di Torino, Torino
fYear
2009
fDate
20-24 April 2009
Firstpage
334
Lastpage
339
Abstract
Clock-gating and power-gating have proven to be very effective solutions for reducing dynamic and static power, respectively. The two techniques may be coupled in such a way that the clock-gating information can be used to drive the control signal of the power-gating circuitry, thus providing additional leakage minimization conditions w.r.t. those manually inserted by the designer. This conceptual integration, however, poses several challenges when moved to industrial design flows. Although both clock and power-gating are supported by most commercial synthesis tools, their combined implementation requires some flexibility in the back-end tools that is not currently available. This paper presents a layout-oriented synthesis flow which integrates the two techniques and that relies on leading-edge, commercial EDA tools. Starting from a gated-clock netlist, we partition the circuit in a number of clusters that are implicitly determined by the groups of cells that are clock-gated by the same register. Using a row-based granularity, we achieve runtime leakage reduction by inserting dedicated sleep transistors for each cluster. The entire flow has been benchmarked on a industrial design mapped onto a commercial, 65 nm CMOS technology library.
Keywords
CMOS digital integrated circuits; clocks; CMOS technology library; clock gating information; concurrent clock; control signal; dedicated sleep transistors; dynamic power; industrial design flow; layout-oriented synthesis flow; power gating circuitry; row-based granularity; static power; CMOS technology; Circuit synthesis; Clocks; Coupling circuits; Electronic design automation and methodology; Minimization; Registers; Runtime; Signal design; Signal synthesis;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation & Test in Europe Conference & Exhibition, 2009. DATE '09.
Conference_Location
Nice
ISSN
1530-1591
Print_ISBN
978-1-4244-3781-8
Type
conf
DOI
10.1109/DATE.2009.5090684
Filename
5090684
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