DocumentCode :
2172273
Title :
A low-cost SEE mitigation solution for soft-processors embedded in Systems on Pogrammable Chips
Author :
Reorda, M. Sonza ; Violante, M. ; Meinhardt, C. ; Reis, R.
Author_Institution :
Politec. di Torino, Turin
fYear :
2009
fDate :
20-24 April 2009
Firstpage :
352
Lastpage :
357
Abstract :
The availability of multimillion Commercial-Off-The-Shelf (COTS) Field Programmable Gate Arrays (FPGAs) is making now possible the implementation on a single device of complex systems embedding processor cores as well as huge memories and ad-hoc hardware accelerators exploiting the programmable logic (Systems on Programmable Chip, or SoPCs). When deployed in safety- or mission-critical applications, as avionic- and space-oriented ones, Singe Event Effects (SEEs) affecting COTS FPGA, which may have catastrophic effects if neglected, have to be considered and SEE mitigation techniques have to be employed. In this paper we explore the adoption of known techniques (such as lockstep, checkpointing and rollback recovery) for SEE mitigation to processors cores embedded in SoPCs, and propose their customization, specifically addressing the characteristics of programmable devices. Since the resulting design flow can easily be supported by automation tools, its adoption is particularly suitable to reduce the design and validation costs. Experimental results show the effectiveness of the proposed approach when compared to conventional TMR-based solutions.
Keywords :
ad hoc networks; costing; embedded systems; field programmable gate arrays; programmable logic devices; COTS; SEE mitigation solution; ad-hoc hardware accelerators; commercial-off-the-shelf; embedded systems; field programmable gate arrays; programmable logic; singe event effects; soft-processors; systems on pogrammable chip; Availability; Costs; Fault tolerance; Field programmable gate arrays; Hardware; Logic devices; Manufacturing; Programmable logic arrays; Redundancy; Space technology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition, 2009. DATE '09.
Conference_Location :
Nice
ISSN :
1530-1591
Print_ISBN :
978-1-4244-3781-8
Type :
conf
DOI :
10.1109/DATE.2009.5090687
Filename :
5090687
Link To Document :
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