Title :
Generation of performance sensitivities for analog cell layout
Author :
Gad-El-Karim, George ; Gyurcsik, Ronald S.
Author_Institution :
North Carolina State University
Keywords :
Analog circuits; Annealing; Circuit simulation; Circuit testing; Circuit topology; Delay; Distributed computing; Machinery; Permission; Voltage;
Conference_Titel :
Design Automation Conference, 1991. 28th ACM/IEEE
Conference_Location :
IEEE
Print_ISBN :
0-89791-395-7
