Title :
Transient plasma dynamics and structural changes below and above the ablation threshold in glasses upon femtosecond laser irradiation
Author :
Siegel, J. ; Puerto, D. ; Bonse, J. ; Bachelier, G. ; Solis, J.
Author_Institution :
Consejo Super. de Investigaciones Cientificas, Madrid
Abstract :
We have used femtosecond-resolved microscopy in order to investigate the temporal and spatial evolution of the ablation process in fused silica upon irradiation with single femtosecond laser pulses at 800 nm. Images of the surface reflectivity at 400 nm have been recorded at different delays after the pump pulse, covering a time span from ~100 fs up to 20 ns. The quantitative analysis of the image sequence allows to determine the ultrafast evolution of the surface reflectivity. Making use of the gaussian beam profile of the pump pulse, the reflectivity evolution can be extracted at different spatial positions (and thus different local fluences) from a single image series at constant peak laser fluence. The results obtained in fused silica are compared to those obtained in other glasses with higher linear and non-linear refractive indices and lower bandgaps.
Keywords :
glass structure; high-speed optical techniques; image sequences; laser ablation; laser beams; optical glass; reflectivity; refractive index; silicon compounds; spatiotemporal phenomena; JkSiO2; ablation threshold; femtosecond laser irradiation; femtosecond-resolved microscopy; fused silica; gaussian beam profile; glass; image sequence; laser fluence; pump pulse; quantitative analysis; refractive index; spatial-temporal evolution; surface reflectivity; transient plasma dynamics; wavelength 400 nm; wavelength 800 nm; Glass; Laser ablation; Laser excitation; Laser transitions; Microscopy; Optical pulses; Plasmas; Pump lasers; Reflectivity; Silicon compounds;
Conference_Titel :
Lasers and Electro-Optics, 2007 and the International Quantum Electronics Conference. CLEOE-IQEC 2007. European Conference on
Conference_Location :
Munich
Print_ISBN :
978-1-4244-0931-0
Electronic_ISBN :
978-1-4244-0931-0
DOI :
10.1109/CLEOE-IQEC.2007.4386834