DocumentCode :
2172449
Title :
Performance evaluation of CNTFET based dynamic dual edge triggered register
Author :
Murotiya, Sneh Lata ; Gupta, Arpan
Author_Institution :
Electr. & Electron. Dept., Birla Inst. of Technol. & Sci., Pilani, India
fYear :
2013
fDate :
21-23 Sept. 2013
Firstpage :
180
Lastpage :
183
Abstract :
Carbon Nanotube Field-Effect Transistor (CNTFET) with 1-D band structure providing better electrostatic control and high mobility due to ballistic transport operation has proved to be a promising alternative to the conventional CMOS technology. This paper presents a design, performance evaluation and comparative analysis for CNTFET based Dynamic Dual Edge Triggered D-Flip flop (DFF). Hspice simulation results shows that the presented DFF consumes significantly lower power and delay than its CMOS counterpart at 32 nm technology. The performance analysis of Serial in serial out register (SISO) based on these DFFs shows 88% reductions in the power delay product.
Keywords :
CMOS integrated circuits; carbon nanotube field effect transistors; electrostatics; flip-flops; trigger circuits; 1D band structure; CNTFET; DFF; Hspice simulation; SISO; ballistic transport operation; carbon nanotube field effect transistor; conventional CMOS technology; dynamic dual edge triggered D-flip flop; dynamic dual edge triggered register; electrostatic control; mobility; power delay product; serial out register; size 32 nm; CMOS integrated circuits; CMOS technology; CNTFETs; Clocks; Integrated circuit modeling; Logic gates; CMOS; CNTFET; Dual Edge Triggered DFF; FF; LSFR; SISO;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Electronic Systems (ICAES), 2013 International Conference on
Conference_Location :
Pilani
Print_ISBN :
978-1-4799-1439-5
Type :
conf
DOI :
10.1109/ICAES.2013.6659387
Filename :
6659387
Link To Document :
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