DocumentCode
2172941
Title
Transition density, a stochastic measure of activity in digital circuits
Author
Najm, Farid N.
Author_Institution
Texas Instruments Inc.
fYear
1991
fDate
21-21 June 1991
Firstpage
644
Lastpage
649
Keywords
Circuit simulation; Density measurement; Digital circuits; Digital integrated circuits; Integrated circuit measurements; Integrated circuit reliability; Permission; Runtime; Stochastic processes; Switching circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 1991. 28th ACM/IEEE
Conference_Location
IEEE
Print_ISBN
0-89791-395-7
Type
conf
Filename
979793
Link To Document