DocumentCode :
2172941
Title :
Transition density, a stochastic measure of activity in digital circuits
Author :
Najm, Farid N.
Author_Institution :
Texas Instruments Inc.
fYear :
1991
fDate :
21-21 June 1991
Firstpage :
644
Lastpage :
649
Keywords :
Circuit simulation; Density measurement; Digital circuits; Digital integrated circuits; Integrated circuit measurements; Integrated circuit reliability; Permission; Runtime; Stochastic processes; Switching circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 1991. 28th ACM/IEEE
Conference_Location :
IEEE
Print_ISBN :
0-89791-395-7
Type :
conf
Filename :
979793
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2172941
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