DocumentCode :
2173079
Title :
KAST: K-associative sector translation for NAND flash memory in real-time systems
Author :
Cho, Hyunjin ; Shin, Dongkun ; Eom, Young Ik
Author_Institution :
Sch. of ICE, Sungkyunkwan Univ., Suwon
fYear :
2009
fDate :
20-24 April 2009
Firstpage :
507
Lastpage :
512
Abstract :
Flash memory is a good candidate for the storage device in real-time systems due to its non-fluctuating performance, low power consumption and high shock resistance. However, the garbage collection for invalid pages in flash memory can invoke a long blocking time. Moreover, the worst-case blocking time is significantly long compared to the best-case blocking time under the current flash management techniques. In this paper, we propose a novel Flash Translation Layer (FTL), called KAST, where user can configure the maximum log block associativity to control the worst-case blocking time. Performance evaluation using simulations shows that the overall performance of KAST is better than the current FTL schemes as well as KAST guarantees the longest block time is shorter than the specified value.
Keywords :
NAND circuits; flash memories; low-power electronics; real-time systems; storage management; K-associative sector translation; KAST; NAND flash memory; best-case blocking time; flash management technique; flash translation layer; garbage collection; high shock resistance; low power consumption; maximum log block associativity configuration; nonfluctuating performance; real-time system; worst-case blocking time; Digital audio players; Digital cameras; Electric shock; Energy consumption; Flash memory; Fluctuations; Hard disks; Ice; Power system management; Real time systems;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition, 2009. DATE '09.
Conference_Location :
Nice
ISSN :
1530-1591
Print_ISBN :
978-1-4244-3781-8
Type :
conf
DOI :
10.1109/DATE.2009.5090717
Filename :
5090717
Link To Document :
بازگشت