DocumentCode
2173195
Title
Vibration fatigue of μBGA solder joint
Author
Tu, P.L. ; Chan, Y.C. ; Tang, C.W. ; Lai, J.K.L.
Author_Institution
Dept. of Electron. Eng., City Univ. of Hong Kong, China
fYear
2000
fDate
2000
Firstpage
1369
Lastpage
1375
Abstract
This paper studies the vibration fatigue failure of μBGA solder-joints reflowed with different temperature profiles, and ageing at 120°C for 1, 4, 9, 16, 25, 36 days. The effect of the thickness of the Ni3Sn4 and Cu-Sn intermetallic compound (IMC) on the fatigue lifetime is also reported. During the vibration fatigue test, in order to identify the failure of μBGA solder joint, electrical interruption was monitored continuously through the daisy-chain network. Our results show that the fatigue lifetime of the solder joint firstly increases and then decreases with increasing heating factor (Qn), which is defined as the integral of the measured temperature over the dwell time above liquidus (183°C) in the reflow profile. The greatest lifetime occurs when Qn is near 500 s°C. Moreover, the lifetime of the solder joint decreases linearly with the increasing fourth root of the ageing time. The SEM/EDX inspection shows that only Ni3Sn4 IMC and Cu6 Sn5/Cu3Sn IMCs are formed between the solder and the nickel-plated PCB pad, and the solder/component-metallization interface respectively. For non-aged samples reflowed with different profiles, the fatigue crack generally initiates at valleys in the rough surface of the interface of the Ni3Sn4 IMC with the bulk solder. Then it propagates mostly near the Ni/solder, and occasionally in the IMC layer or along the Ni/solder interface. For aged samples, the fatigue crack mostly initiates and propagates in the Cu6Sn5-phase/bulksolder interface or the Cu3 Sn/Cu6Sn5 interface on component-metallization. Evidently, the intermetallic compounds contribute mainly to the fatigue failure of μBGA solder joints. The thicker the IMC layer, the shorter the fatigue lifetime of solder joint. The initial formation of the IMCs at the interface during soldering ensures a good metallurgical bond between the solder and the substrate. However, a thick IMC layer influences the solder joint strength, which results in mechanical failure due to volume shrinkage during the transformation from solid phase to the intermetallic compound
Keywords
ageing; ball grid arrays; fatigue; reflow soldering; vibrations; 120 C; Cu3Sn; Cu6Sn5; Ni3Sn4; SEM/EDX inspection; ageing; heating factor; intermetallic compound formation; micro-BGA solder joint; reflow temperature profile; vibration fatigue; Aging; Condition monitoring; Fatigue; Heating; Intermetallic; Q measurement; Soldering; Temperature measurement; Testing; Tin;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components & Technology Conference, 2000. 2000 Proceedings. 50th
Conference_Location
Las Vegas, NV
Print_ISBN
0-7803-5908-9
Type
conf
DOI
10.1109/ECTC.2000.853388
Filename
853388
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