• DocumentCode
    2173455
  • Title

    Selective light Vth hopping (SLITH): Bridging the gap between runtime dynamic and leakage

  • Author

    Hao Xu ; Vemuri, Ranga ; Jone, Wen-Ben

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Cincinnati, Cincinnati, OH
  • fYear
    2009
  • fDate
    20-24 April 2009
  • Firstpage
    594
  • Lastpage
    597
  • Abstract
    Ever since the invention of various leakage power reduction techniques, leakage and dynamic power reduction techniques are categorized into two separate sets. Most of them cannot be applied together during runtime. The gap between them is due to the large energy breakeven time (EBT) and wakeup time (WUT) of conventional leakage reduction techniques. This paper proposes a new leakage reduction technique (SLITH) based on Vth hopping. SLITH has very low EBT and WUT, yet keeps the effectiveness of leakage reduction. Thus, it is able to reduce the gap, and enables joint dynamic and leakage power reduction. SLITH can be applied together with clock gating, precomputation and operand isolation etc., and significantly reduces both dynamic and active leakage power consumption.
  • Keywords
    MOSFET; electrical faults; MOSFET scaling; active leakage power consumption; clock gating; conventional leakage reduction techniques; energy breakeven time; leakage power reduction techniques; selective light Vth hopping; Clocks; Energy consumption; Gate leakage; Isolation technology; MOSFET circuits; Power MOSFET; Power generation; Runtime; Subthreshold current; Tuned circuits; Vth hopping; energy breakeven time; runtime leakage power reduction; wake-up time;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition, 2009. DATE '09.
  • Conference_Location
    Nice
  • ISSN
    1530-1591
  • Print_ISBN
    978-1-4244-3781-8
  • Type

    conf

  • DOI
    10.1109/DATE.2009.5090735
  • Filename
    5090735