DocumentCode
2173455
Title
Selective light Vth hopping (SLITH): Bridging the gap between runtime dynamic and leakage
Author
Hao Xu ; Vemuri, Ranga ; Jone, Wen-Ben
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Cincinnati, Cincinnati, OH
fYear
2009
fDate
20-24 April 2009
Firstpage
594
Lastpage
597
Abstract
Ever since the invention of various leakage power reduction techniques, leakage and dynamic power reduction techniques are categorized into two separate sets. Most of them cannot be applied together during runtime. The gap between them is due to the large energy breakeven time (EBT) and wakeup time (WUT) of conventional leakage reduction techniques. This paper proposes a new leakage reduction technique (SLITH) based on Vth hopping. SLITH has very low EBT and WUT, yet keeps the effectiveness of leakage reduction. Thus, it is able to reduce the gap, and enables joint dynamic and leakage power reduction. SLITH can be applied together with clock gating, precomputation and operand isolation etc., and significantly reduces both dynamic and active leakage power consumption.
Keywords
MOSFET; electrical faults; MOSFET scaling; active leakage power consumption; clock gating; conventional leakage reduction techniques; energy breakeven time; leakage power reduction techniques; selective light Vth hopping; Clocks; Energy consumption; Gate leakage; Isolation technology; MOSFET circuits; Power MOSFET; Power generation; Runtime; Subthreshold current; Tuned circuits; Vth hopping; energy breakeven time; runtime leakage power reduction; wake-up time;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation & Test in Europe Conference & Exhibition, 2009. DATE '09.
Conference_Location
Nice
ISSN
1530-1591
Print_ISBN
978-1-4244-3781-8
Type
conf
DOI
10.1109/DATE.2009.5090735
Filename
5090735
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