Bessel-type interference patterns detected in single photon regime

Author

Grunwald, R. ; Bock, M.

Author_Institution

Max-Born-Inst. for Nonlinear Opt. & Ultrafast Spectrosc., Berlin

fYear

2007

fDate

17-22 June 2007

Firstpage

1

Lastpage

1

Abstract

In this experiment, pseudonondiffracting Bessel-like intensity distributions were generated by refractive axicons at extremely weak illumination and detected by an electron multiplication CCD (EMCCD) camera (iXon, Andor) without an image intensifier. The successive growth of Bessel-like interference fringes from noise can clearly be recognized without image processing. The results of the interference experiment confirm the non-local quantum mechanical nature of single photon diffraction. In contrast to the Young´s setup with a diffracting double slit, the interference from refracted beams was observed in the near-field instead of the far field.

Keywords

CCD image sensors; laser beams; light diffraction; light interference; quantum optics; Bessel-type interference fringe patterns; EMCCD camera; Young´s setup; diffracting double slit; diode laser light source; electron multiplication CCD; extremely weak illumination condition; nonlocal quantum mechanical nature; photon diffraction; pseudonondiffracting Bessel-like intensity distributions; refracted beam interference; refractive axicons; single photon regime; Charge coupled devices; Charge-coupled image sensors; Diffraction; Electrons; Image intensifiers; Image processing; Image recognition; Interference; Lighting; Optical refraction;

fLanguage

English

Publisher

ieee

Conference_Titel

Lasers and Electro-Optics, 2007 and the International Quantum Electronics Conference. CLEOE-IQEC 2007. European Conference on

Conference_Location

Munich

Print_ISBN

978-1-4244-0931-0

Electronic_ISBN

978-1-4244-0931-0

Type

conf

DOI

10.1109/CLEOE-IQEC.2007.4386886

Filename

4386886