DocumentCode
2173806
Title
The effect of temperature cycling on fiber-solder-ferrule joints in laser module packaging
Author
Cheng, W.H. ; Sheen, M.T. ; Kuang, J.H. ; Chen, J.C. ; Wang, G.L. ; Wang, S.C. ; Chang, H.L. ; Wang, C. ; Wang, C.M.
Author_Institution
Inst. of Electro-Opt. Eng., Nat. Sun Yat-Sen Univ., Kaohsiung, Taiwan
fYear
2000
fDate
2000
Firstpage
1498
Lastpage
1503
Abstract
The thermally-induced fiber alignment shifts of fiber-solder-ferrule (FSF) joints in laser module packaging have been studied experimentally and numerically. Direct measurements of the metallographic photos with and without temperature cycling, fiber displacement shifts of up to a 0.8 μm were found after undergoing 500 temperature cycles. Experimental results show that the fiber shifts increase as the temperature cycle number and the initial fiber eccentric offset increase. The major cause of fiber shift may come from the plastic solder yielding introduced by the thermal stress variation and the redistribution of the residual stresses during temperature cycling. A finite-element method (FEM) analysis was performed to evaluate the variation of thermal stresses, the distribution of residual stresses, and fiber shifts of the FSF joints. Experimental measurements were in reasonable agreement with the numerical calculations. Both results indicate that the initial offset introduced in the fiber soldering process is a key parameter in causing the thermally-induced fiber shift of FSF joints in laser module packaging. The fiber shift, and hence fiber alignment shift under temperature cycling tests can be reduced significantly if the fiber can be located close to the center of the ferrule
Keywords
finite element analysis; internal stresses; modules; optical fibre couplers; semiconductor device packaging; semiconductor lasers; soldering; thermal stresses; alignment shift; fiber-solder-ferrule joint; finite element method; residual stress; semiconductor laser module packaging; temperature cycling; thermal stress; Displacement measurement; Fiber lasers; Finite element methods; Optical fiber testing; Packaging; Plastics; Residual stresses; State feedback; Temperature; Thermal stresses;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components & Technology Conference, 2000. 2000 Proceedings. 50th
Conference_Location
Las Vegas, NV
Print_ISBN
0-7803-5908-9
Type
conf
DOI
10.1109/ECTC.2000.853412
Filename
853412
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