• DocumentCode
    2173893
  • Title

    Correction and Extraction Techniques for Dielectric Constant Determination Using a Ka-Band Free-Space Measurement System

  • Author

    Gagnon, Nicolas ; Shaker, Jafar ; Berini, Pierre ; Roy, Langis ; Petosa, Aldo

  • Author_Institution
    Communications Research Centre Canada, 3701 Carling Ave., P.O. Box 11490, Station H, Ottawa, Ontario, Canada K2H 8S2, e-mail: nicolas.gagnon@crc.ca
  • fYear
    2002
  • fDate
    23-26 Sept. 2002
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    An improved procedure for determining the dielectric constant of materials using a Ka-band free-space quasi-optical measurement system is presented. Two correction terms are introduced to compensate for both errors caused by the lateral misplacement of the sample and by the calibration procedure. Two robust numerical extraction techniques, a root-finding algorithm and a genetic algorithm, are used to extract the dielectric constant from S-parameter measurements. Good agreement was observed between the results obtained with the corrected free-space measurements and measurements performed by an independent standards testing organisation.
  • Keywords
    Calibration; Dielectric constant; Dielectric materials; Dielectric measurements; Error correction; Genetic algorithms; Measurement standards; Performance evaluation; Robustness; Scattering parameters;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference, 2002. 32nd European
  • Conference_Location
    Milan, Italy
  • Type

    conf

  • DOI
    10.1109/EUMA.2002.339410
  • Filename
    4140490