Title :
An accurate broadband measurement of complex permittivity using microstrip lines
Author :
Jastrzebski, Adam K. ; Chuprin, Andrei D.
Author_Institution :
Department of Electronics, University of Kent, Canterbury, Kent, CT2 7NT UK. Phone +44 1227 823704; Fax +44 1227 456084; E-mail A.K.Jastrzebski@ukc.ac.uk
Abstract :
A technique for determining complex permittivity of dielectric materials using VNA measurements of microstrip lines is presented. A method of taking into account dispersion properties of in-fixture TRL calibration standards has been developed. Complex permittivity of Corning 7740 glass and alumina have been measured over the frequency range 1-40 GHz. Comparison of different measurement techniques has been conducteds.
Keywords :
Calibration; Coplanar waveguides; Dielectric measurements; Dielectric substrates; Frequency measurement; Glass; Measurement standards; Microstrip; Permittivity measurement; Scattering parameters;
Conference_Titel :
Microwave Conference, 2002. 32nd European
Conference_Location :
Milan, Italy
DOI :
10.1109/EUMA.2002.339413
