• DocumentCode
    2174032
  • Title

    Improved performance and variation modelling for hierarchical-based optimisation of analogue integrated circuits

  • Author

    Ali, Sawal ; Ke, Li ; Wilcock, Reuben ; Wilson, Peter

  • Author_Institution
    Electron. Syst. Devices Group, Univ. of Southampton, Southampton
  • fYear
    2009
  • fDate
    20-24 April 2009
  • Firstpage
    712
  • Lastpage
    717
  • Abstract
    A new approach in hierarchical optimisation is presented which is capable of optimising both the performance and yield of an analogue design. Performance and yield trade offs are analysed using a combination of multi-objective evolutionary algorithms and Monte Carlo simulations. A behavioural model that combines the performance and variation for a given circuit topology is developed which can be used to optimise the system level structure. The approach enables top-down system optimisation, not only for performance but also for yield. The model has been developed in Verilog-A and tested extensively with practical designs using the Spectre simulator. A performance and variation model of a 5 stage voltage controlled ring oscillator has been developed and a PLL design is used to demonstrate hierarchical optimisation at the system level. The results have been verified with transistor level simulations and suggest that an accurate performance and yield prediction can be achieved with the proposed algorithm.
  • Keywords
    Monte Carlo methods; analogue integrated circuits; circuit optimisation; evolutionary computation; hardware description languages; integrated circuit design; integrated circuit modelling; integrated circuit yield; network topology; phase locked loops; voltage-controlled oscillators; Monte Carlo simulation; PLL design; Spectre simulator; Verilog-A; analogue integrated circuit; behavioural model; circuit topology; hierarchical-based optimisation; multiobjective evolutionary algorithm; system level structure; transistor level simulation; voltage controlled ring oscillator; Algorithm design and analysis; Analog integrated circuits; Circuit testing; Circuit topology; Design optimization; Evolutionary computation; Hardware design languages; Integrated circuit modeling; Integrated circuit yield; Performance analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition, 2009. DATE '09.
  • Conference_Location
    Nice
  • ISSN
    1530-1591
  • Print_ISBN
    978-1-4244-3781-8
  • Type

    conf

  • DOI
    10.1109/DATE.2009.5090757
  • Filename
    5090757