Title :
Improved performance and variation modelling for hierarchical-based optimisation of analogue integrated circuits
Author :
Ali, Sawal ; Ke, Li ; Wilcock, Reuben ; Wilson, Peter
Author_Institution :
Electron. Syst. Devices Group, Univ. of Southampton, Southampton
Abstract :
A new approach in hierarchical optimisation is presented which is capable of optimising both the performance and yield of an analogue design. Performance and yield trade offs are analysed using a combination of multi-objective evolutionary algorithms and Monte Carlo simulations. A behavioural model that combines the performance and variation for a given circuit topology is developed which can be used to optimise the system level structure. The approach enables top-down system optimisation, not only for performance but also for yield. The model has been developed in Verilog-A and tested extensively with practical designs using the Spectre simulator. A performance and variation model of a 5 stage voltage controlled ring oscillator has been developed and a PLL design is used to demonstrate hierarchical optimisation at the system level. The results have been verified with transistor level simulations and suggest that an accurate performance and yield prediction can be achieved with the proposed algorithm.
Keywords :
Monte Carlo methods; analogue integrated circuits; circuit optimisation; evolutionary computation; hardware description languages; integrated circuit design; integrated circuit modelling; integrated circuit yield; network topology; phase locked loops; voltage-controlled oscillators; Monte Carlo simulation; PLL design; Spectre simulator; Verilog-A; analogue integrated circuit; behavioural model; circuit topology; hierarchical-based optimisation; multiobjective evolutionary algorithm; system level structure; transistor level simulation; voltage controlled ring oscillator; Algorithm design and analysis; Analog integrated circuits; Circuit testing; Circuit topology; Design optimization; Evolutionary computation; Hardware design languages; Integrated circuit modeling; Integrated circuit yield; Performance analysis;
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition, 2009. DATE '09.
Conference_Location :
Nice
Print_ISBN :
978-1-4244-3781-8
DOI :
10.1109/DATE.2009.5090757