DocumentCode
2174122
Title
Thermal stability of thermoelectric properties for nondoped PbTe
Author
Tanaka, Kentaro ; Kohri, Hitoshi ; Shiota, Ichiro ; Nishida, Isao A.
Author_Institution
Graduate Sch., Kogakuin Univ., Tokyo, Japan
fYear
2001
fDate
2001
Firstpage
154
Lastpage
156
Abstract
The undoped PbTe compounds were prepared by the vertical Bridgman method. Hall coefficient RH and ρ were measured by a d.c. four-terminal method. The temperature dependence of ρ and RH were measured in the temperature range from 700 to 300K in an Ar atmosphere. PbTe showed p-type conduction at 300K and was transformed to n-type conduction at about 500K. No thermal hysteresis was observed in the temperature dependence of ρ for the heating temperature below 500K at slower cooling rates than 8.88×10-2K/s and at cooling rates above 6.45×10-1 K/s from 700K. The thermal hysteresis in the temperature dependence of ρ was confirmed at a slower cooling rate than 8.88×10-2K/s at temperatures higher than 600K. The Hall concentration of a specimen which showed thermal hysteresis in the ρ-curve at the slow cooling rate of 8.88×10-2K/s from 700K was found to be 1.25×1024/m3 smaller, 1/3 of that with no thermal hysteresis
Keywords
Hall effect; IV-VI semiconductors; crystal growth from melt; lead compounds; thermal stability; thermoelectricity; 700 to 300 K; Ar atmosphere; Hall coefficient; PbTe; cooling rate; n-type conduction; p-type conduction; temperature dependence; thermal hysteresis; thermoelectric properties; vertical Bridgman method; Argon; Atmosphere; Atmospheric measurements; Cooling; Hysteresis; Temperature dependence; Temperature distribution; Temperature measurement; Thermal stability; Thermoelectricity;
fLanguage
English
Publisher
ieee
Conference_Titel
Thermoelectrics, 2001. Proceedings ICT 2001. XX International Conference on
Conference_Location
Beijing
ISSN
1094-2734
Print_ISBN
0-7803-7205-0
Type
conf
DOI
10.1109/ICT.2001.979845
Filename
979845
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