Title :
Effect of Na-site partial substitutions on the thermoelectric properties of layered oxide NaxCo2O4
Author :
Nagira, Tomoya ; Ito, Mikio ; Katsuyama, Shigeru ; Majma, Kazuhiko ; Nagai, Hiroto
Author_Institution :
Dept. of Mater. Sci. & Process., Osaka Univ., Japan
Abstract :
Polycrystalline samples of (Na1-yMy)x Co2O4 (M=K Sr, Y, Nd, Sm and Yb; y=0.01~0.35) were prepared by using a solid state reaction method. The effects of the Na-site partial substitutions on the thermoelectric properties of NaxCo2O4 from room temperature to 1073 K were investigated. For the Sr-substitution sample, the thermoelectric power and the resistivity increased, and the electronic contribution to the thermal conductivity decreased compared to the non-substitution sample. These effects mean the reduction of the carrier density. As a result of that, for the Sr-substitution sample, the figure of merit was slightly improved. On the other hand, for rare-earth-metal-substitution samples, the anomalous substitution effects were observed. That is, in spite of the fact that the electronic contribution to the thermal conductivity decreased, the thermoelectric power decreased and the electrical resistivity increased. For all substitution samples except for Y-substitution, the lattice contribution to the thermal conductivity decreased because of the phonon scattering resulting in the decrease in the thermal conductivity
Keywords :
carrier density; electrical resistivity; neodymium compounds; phonons; potassium compounds; samarium compounds; sodium compounds; strontium compounds; thermal conductivity; thermoelectric power; ytterbium compounds; yttrium compounds; 1073 to 293 K; Na-site partial substitutions; NaKCo2O4; NaNdCo2O4; NaSmCo2O4; NaSrCo2O4; NaYCo2O4; NaYbCo2O4; carrier density; figure of merit; phonon scattering; polycrystalline samples; resistivity; solid state reaction; thermal conductivity; thermoelectric power; Charge carrier density; Electric resistance; Lattices; Neodymium; Solid state circuits; Strontium; Temperature; Thermal conductivity; Thermal resistance; Thermoelectricity;
Conference_Titel :
Thermoelectrics, 2001. Proceedings ICT 2001. XX International Conference on
Conference_Location :
Beijing
Print_ISBN :
0-7803-7205-0
DOI :
10.1109/ICT.2001.979849