Title :
Review of the reliability of advanced component packaging technologies
Author :
Németh, Pál ; Illyefalvi-Vitez, Zsolt ; Harsányi, Gábor
Author_Institution :
Dept. of Electron. Technol., Tech. Univ. Budapest, Hungary
Abstract :
Reliability is one of the most important questions in any applications both on package (component), and on board (system) level. In particular, the reliability requirements of automotive under-hood applications are very severe and diverse. Lifetime of an under-hood electronic unit must be 10…20 years, the operation temperature range is -40…150°C (depending on the application zone) and the acceleration is 4 g…100 g. The reliability data presented by different component manufacturers were analyzed, compared and evaluated. From the point of view of the analyzed component types, ball grid array packages (BGAs) are in the focus, since they are being considered as replacements for peripheral-leaded plastic quad flat packs (PQFPs) for most future electronics applications. In general, BGAs include packages made of plastic (PBGA) or ceramic (CBGA) materials, using conventional or tape automated bonding (TAB) construction (TBGA), and of very small dimensions called chip scale packages (CSPs). A multichip module packaged in appropriate format is also considered BGA
Keywords :
packaging; reliability; TBGA; automotive under-hood electronic unit; ball grid array; ceramic BGA; chip scale package; multichip module; packaging technology; plastic BGA; plastic quad flat pack; reliability; tape automated bonding; Acceleration; Automotive engineering; Building materials; Ceramics; Chip scale packaging; Electronics packaging; Manufacturing; Plastic packaging; Temperature dependence; Temperature distribution;
Conference_Titel :
Electronic Components & Technology Conference, 2000. 2000 Proceedings. 50th
Conference_Location :
Las Vegas, NV
Print_ISBN :
0-7803-5908-9
DOI :
10.1109/ECTC.2000.853430