DocumentCode
2174297
Title
Automated RDSon characterization for power MOSFETS
Author
Escalona-Cruz, Pedro J. ; Jimenez-Cedeno, Manuel A. ; Palomera-Garcia, Rogelio
Author_Institution
Dept of Electrical and Computer Engineering, University of Puerto Rico, Mayaguez, PR
fYear
2015
fDate
24-27 Feb. 2015
Firstpage
1
Lastpage
4
Abstract
This paper presents an automated RDSon characterization test for Power MOSFETS. Considerations for both hardware and software development, and integration have been performed. Raw data can be captured in a single pulse setup by logging the data in a customized spreadsheet. This allows for observing the instantaneous and over time behavior of the device resistance. A qualification of the test was done with packaged devices. It was found that the solution presented here is robust, simple, yet performable with low-cost with of-the-shelf test equipment.
Keywords
Clamps; Hardware; Logic gates; MOSFET; Oscilloscopes; Power MOSFETS; Rdson; automation;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits & Systems (LASCAS), 2015 IEEE 6th Latin American Symposium on
Conference_Location
Montevideo, Uruguay
Type
conf
DOI
10.1109/LASCAS.2015.7250483
Filename
7250483
Link To Document