Title :
Automated RDSon characterization for power MOSFETS
Author :
Escalona-Cruz, Pedro J. ; Jimenez-Cedeno, Manuel A. ; Palomera-Garcia, Rogelio
Author_Institution :
Dept of Electrical and Computer Engineering, University of Puerto Rico, Mayaguez, PR
Abstract :
This paper presents an automated RDSon characterization test for Power MOSFETS. Considerations for both hardware and software development, and integration have been performed. Raw data can be captured in a single pulse setup by logging the data in a customized spreadsheet. This allows for observing the instantaneous and over time behavior of the device resistance. A qualification of the test was done with packaged devices. It was found that the solution presented here is robust, simple, yet performable with low-cost with of-the-shelf test equipment.
Keywords :
Clamps; Hardware; Logic gates; MOSFET; Oscilloscopes; Power MOSFETS; Rdson; automation;
Conference_Titel :
Circuits & Systems (LASCAS), 2015 IEEE 6th Latin American Symposium on
Conference_Location :
Montevideo, Uruguay
DOI :
10.1109/LASCAS.2015.7250483