• DocumentCode
    2174297
  • Title

    Automated RDSon characterization for power MOSFETS

  • Author

    Escalona-Cruz, Pedro J. ; Jimenez-Cedeno, Manuel A. ; Palomera-Garcia, Rogelio

  • Author_Institution
    Dept of Electrical and Computer Engineering, University of Puerto Rico, Mayaguez, PR
  • fYear
    2015
  • fDate
    24-27 Feb. 2015
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    This paper presents an automated RDSon characterization test for Power MOSFETS. Considerations for both hardware and software development, and integration have been performed. Raw data can be captured in a single pulse setup by logging the data in a customized spreadsheet. This allows for observing the instantaneous and over time behavior of the device resistance. A qualification of the test was done with packaged devices. It was found that the solution presented here is robust, simple, yet performable with low-cost with of-the-shelf test equipment.
  • Keywords
    Clamps; Hardware; Logic gates; MOSFET; Oscilloscopes; Power MOSFETS; Rdson; automation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits & Systems (LASCAS), 2015 IEEE 6th Latin American Symposium on
  • Conference_Location
    Montevideo, Uruguay
  • Type

    conf

  • DOI
    10.1109/LASCAS.2015.7250483
  • Filename
    7250483