• DocumentCode
    2174329
  • Title

    Cost analysis of compliant wafer level package

  • Author

    Patel, Chirag S. ; Realff, Matthew ; Merriweather, Samuel ; Power, Chris ; Martin, Kevin ; Meindl, James D.

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    1634
  • Lastpage
    1639
  • Abstract
    Low cost package solutions are required by the semiconductor industry to meet the growing demand of high performance and high functionality in electronic products. In particular, the International Technology Roadmap for Semiconductors (ITRS) projects the package cost per pin to be as low as (0.30-1.26 cents) in 1999 to (0.27-0.93 cents) in 2005 to (0.24-0.68 cents) in 2011. To satisfy this need, a Compliant Wafer Level Package (CWLP) technology has been developed that: (a) packages all of the ICs intact on the wafer at once, and (b) fabricates all of the compliant Input/Output (I/O) connections monolithically in one step. Using discrete event simulations, a detailed manufacturing cost model for the CWLP is described. In contrast to the conventional packages where the cost of the package increases with the I/O count, the CWLP cost is independent of the I/O count because all of the I/Os are monolithically fabricated in one step. For 6-inch wafers and throughput greater than 50,000 wafers per year, the manufacturing cost of the CWLP is computed to be $26.65 per wafer. The percent contributions of the material, equipment and labor to the total cost is calculated to be 87%, 9%, and 4%, respectively
  • Keywords
    costing; discrete event simulation; integrated circuit economics; integrated circuit packaging; IC packaging; compliant wafer level package; discrete event simulation; input/output connection; manufacturing cost analysis; monolithic fabrication; Cost function; Discrete event simulation; Electronics industry; Electronics packaging; Industrial electronics; Semiconductor device modeling; Semiconductor device packaging; Throughput; Virtual manufacturing; Wafer scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components & Technology Conference, 2000. 2000 Proceedings. 50th
  • Conference_Location
    Las Vegas, NV
  • Print_ISBN
    0-7803-5908-9
  • Type

    conf

  • DOI
    10.1109/ECTC.2000.853437
  • Filename
    853437