Title :
A novel approach to entirely integrate Virtual Test into test development flow
Author :
Lu, Ping ; Glaser, Daniel ; Uygur, Gürkan ; Helmreich, Klaus
Author_Institution :
Dept. of Comput. Aided Circuit Design, Friedrich-Alexander-Univ. Erlangen-Nuremberg, Erlangen
Abstract :
In this paper, we present an open architecture virtual test environment (VTE) which can be easily integrated into various modularized automatic test systems (ATS) compliant to Open Standard Architecture (OSA). The focus of this paper is to analyze and address the major issues that still prevent the application of virtual test (VT) from day-to-day´s practice. As a pilot demonstration, a VHDL-AMS based VTE is established and an ADC test is performed. The environment is intended to seamlessly interoperate with the test system during test program development procedure.
Keywords :
automatic test equipment; hardware description languages; virtual instrumentation; ADC test; ATE systems; Open Standard Architecture; VHDL-AMS based VTE; automatic test systems; open architecture virtual test environment; test development system; test program development; Automatic testing; Circuit testing; Computer architecture; Hardware; Instruments; Life testing; Performance evaluation; Software testing; Standards development; System testing; ATML; Hardware description language; IEEE1641; Simulation; Test generation; VHDL; Virtual Test;
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition, 2009. DATE '09.
Conference_Location :
Nice
Print_ISBN :
978-1-4244-3781-8
DOI :
10.1109/DATE.2009.5090772